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Student Toolbox
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Equipment

The Microscopy and Microanalysis Research Laboratory (MMRL) is a research unit at the College of Science and Mathematics at Montclair State University. The MMRL is University wide resource and facility. Access to the MMRL and its microscopes is open to all potential University users who have a need for the facilities in their research and classes, as well as external public and private sector clients.

The MMRL is located on the first floor of the Mallory Hall, which is across from the Student Center and Richardson Hall. Currently, the MMRL houses transmission electron, scanning electron microscopes, and atomic force microscope. The microscopes available for use include:

  • Hitachi H-7500 transmission electron microscope
  • Hitachi S-3400N variable pressure scanning electron microscope with x-ray analysis and digital imaging
  • Hitachi S-2460N scanning electron microscope with x-ray analysis

In addition, the following items are also available for MMRL users:

  • Three Leica 2030 rotary paraffin microtome
  • Two LKB ultramicrotomes
  • A LKB 7800 glass knife maker
  • Leica Reichert Ultratrim
  • Denton critical point dryer
  • Denton sputter coaters (Desk II and Desk IV)
  • Denton Vacuum evaporators (DV-502A)
  • Liquid nitrogen dewars (various sizes)
  • A Leica stereo dissecting microscope
  • A Tissue-TeK VIP Tissue Processor
  • A Tissue-TeK II Embedding Center

Hitachi H-7500 TEM

The Hitachi H-7500 tungsten/LaB6 TEM is an instrument suitable for high magnification examination of biological tissues and soft materials. It is fitted with Bruker thin-window energy dispersive X-ray (EDS) detector which is capable of detecting elements ranging from boron upwards. A slow scan AMT CCD camera with pixel resolution 1024 x1024 is fitted side mount to the column.

The status of the electron microscope is displayed graphically on TEM computer, which allows the user to call out window for setting parameters to suit their needs.

Microscope Ability:

  • Resolution: Point-to-point resolution 0.23nm
  • Accelerating voltage: 20 kV - 120 kV
  • Magnifications:
    • ZOOM (HC mode) × 700 to × 200,000 (30 steps)
      (HR mode) × 4,000 to × 600,000 (20 steps)
    Low MAG   × 50 to 1,000 (10 steps)
  • Specimen stage: Maximum specimen tilt 20°
  • PGT Prism 2000 Energy Dispersive X-ray Spectrometer (C-U)
    Spectral point acquisition
    X-ray line scans
    X-ray Mapping
  • AMT side mount Slow Scan CCD (1024 x 1024)
    Wide field-of-view for image interpretation
    Real time background correction

Hitachi S-3400N SEM

The Hitachi S-3400N is a Variable Pressure SEM (VP-SEM) offering advances in automatic l filament saturation and "no touch" objective aperture alignment. High take off angle ports were built to the analytical chamber for detectors such as EDS. A Quad-type semiconductor BSE detector is mounted at the bottom of the objective porepiece, allowing compositional and high resolution imaging at a high or low vacuum mode.

Microscope Ability:

  • Resolution
    • Secondary electron image (SEI) 3.0 nm resolution in high vacuum mode at 30 kV
      10 nm resolution in high vacuum mode at 3 kV
    Backscattered electron image (BSI) 4.0 nm resolution in low vacuum mode at 30 kV
  • Electron source: Pre-centered cartridge type tungsten hairpin filament
  • Accelerating voltage: 0.3kV to 30 kV
  • Unique VP-mode of operation
    The VP-mode allows microscopy can operate analysis at pressure settings ranging from 6 Pa through 270 Pa in the sample chamber. Wet, oily and non-conductive samples in their natural state without charge-up and without the need of conventional sample preparation.
  • Bruker –AXS Xflash X-Ray Detector
    A silicon drift detector (SDD)
    Processing of up to 1,000,000 signals per
    Maintenance-free and vibration free detector and
    No need for liquid nitrogen
    Qualitative and Quantitative elemental analysis
    X-ray line scans
    X-ray Mapping
    Quad-Type semiconductor backscattered electron detector providing information of composition and topography of sample surface. Useable at both high and low vacuum mode.

Hitachi S-2460 SEM

The Hitachi S-2460N SEM is a conventional SEM plus "Variable Pressure" in low vacuum conditions. The PGT System provides digital imaging, spectral imaging, and full qualitative and quantitative x-ray analysis.

Microscope Ability:

  • Resolution
    • 4 nm at accelerated voltage 25 kV and WD 5 mm in high vacuum mode
    6 nm in N-SEM mode
  • Magnification: 20 X to 200 kX
  • Accelerating voltage: 0.5 ~ 30 kV
  • Vacuum mode:
    This SEM provides high vacuum up to 7 × 10-4 Pa (SEM mode) and low vacuum ranging from 1 Pa to 270 Pa (N-SEM mode)
  • Robison type BSE detector:
    Using scintillator technology to acquire composition and topography information of samples
  • PGT EDS detector for X-ray microanalysis and mapping

Angstrom AA5000 Multi-Function Scanning Probe Microscope

The AA5000 Scanning Probe Microscope (SPM) is Angstrom's most innovated model. It features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing. The AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, the AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in the AA5000 SPM system.

Features:

  • Lateral Force Microscope (LFM), Scanning Tunneling Microscope (STM), Conductive AFM, SPM in liquid, Environmental Control SPM, Nano-Processing System including Lithography Mode and Vector Scan Mode
  • Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM
  • Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode
  • Resolution:
    AFM: 0.26nm lateral, 0.1nm vertical
    STM: 0.13nm lateral, 0.01nm vertical
  • Real-time temperature and humidity detecting
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve
  • Fast automatically tip-engaging
  • Simply change of the tip holder to switch between STM and AFM
  • Trace-Retrace scan, Back-Forward scan
  • Full digital control, auto system status recognition
  • Adjustable lightening inside
  • Large sample size: up to diameter 45mm, 30mm thick
  • With a 32-bit Digital Signal Processor (DSP)
  • Online Control Software and offline Image Processing Software for Windows
  • Multi-Analysis: Granularity and Roughness

Denton Desk IV TSC Cold Sputter/Etch and Carbon Rod Accessory

This tool is used to sputter a conductive film gold or old/palladium) on samples for SEM analysis and to provide some limited surface clearing in some models. The mounting of a turbo molecular pump to the system enable to quickly pump the chamber to a high vacuum level. Six main operations are available for the system: vacuum, etch, rotating, sputter, time etch and time sputter.

Features:

  • pc part: >= 5 mm
  • Wafers or SEM stub: 50 mm to 100 mm round

Specifications/Capabilities:

  • Chamber: 6" OD x 6" H Cylindrial metal chamber
  • Au or Au/Pd target
  • Argon gas
  • Etch mode for cleaning of samples prior metal deposition
  • Manual or automatic timed sputter/etch
  • Carbon evaporation

Typical Applications:

  • Coating a thin layer of metal or carbon film to remove SEM charge effects from non-conductive samples

Denton Desk II Sputter

Denton Desk II Sputter Coater is a unit allows reproducible coat a thin layer of metal film to a sample to be viewed in the Scanning Electron Microscope (SEM). Deposits gold or gold-palladium in thickness from 10-50nm.

Denton DV-502A High Vacuum Evaporator

DV-502A is a high vacuum evaporator for fine carbon (for X-ray microanalysis) or metal evaporation of scanning and transmission electron microscopy samples. using Denton’s economical diffusion pump design, it can rapidly and repeatedly cycle from atmosphere to high vacuum.

Carbon coatings can be evaporated onto grids as a support layer or as an additional stabilizing agent for polymer coated grids. Grids that will be used for imaging isolated macromolecules (such as proteins) can be glow discharged to decrease their hydrophobicity.

Denton Vacuum DCP-1 Critical Point Dryer

The Denton critical point drying apparatus is mounted on a sturdy stand with a weighted base which sets conveniently on the laboratory bench. It is being used to critical point of liquid carbon dioxide (CO2) to dry biological material with a graded series of ethanol. The chamber is 1-1/8” dia. × 2-5/8” high and will hold a large number of grids or a half dozen SEM stubs. A removable stainless steel wire basket 1” dia. × 2-1/2” long is also supplied.

Leica 2030 rotary paraffin microtome

Reichert/Leica 2030 Microtome is designed for most routine histology, biology needs.  High precision and stability ensures reproducible section quality in wax and plastic embedded sections. It has a smooth handwheel movement that allows controllable sectioning speed with zero backlash. Vertical roller veering sideway prevents any deviation of specimen cylinder during sectioning. A section counter and the automatic specimen feed is 1 to 60 um. Three Reichert microtomes are available in our EM facilities.

Leica Reichert Ultratrim

Leica Reichert ultratrim is an EM specimen trimmer built-in high speed milling device. The ultratrim consists of stereo microscope with 20x total magnification, illuminator 20W reflector halogen light, specimen carrier, and trimming tool. Trimming is carried out during observation of the specimen with the microscope, using a special milling tool which is moved past the specimen. The specimen can be centered ± 2 mm and rotated about 90°C click stop mechanism for milling the pyramid faces. The selected detail remains in the center of the field during each operation.

LKB Ultramicrotomes

An instrument that is used to cut sections or slices of specimens embedded in resin for examination by light or electron microscopy. The ultramicrotome uses a glass knife to cut 1.0 µm thick sections that are mounted on to a glass slide for examination in a light microscope. A diamond knife is used to cut very thin sections, approximately 70-90 nm in thickness, that are collected on a 3 mm diameter copper grid for observation in the TEM.

Tissue-TeK VIP Tissue Processor

EM tissue processor provides a compact system for automatically processing biological specimens for high resolution light microscope examination.

Tissue-TeK II Embedding Center

Tissue-Tek 2 Tissue Embedding Center is a compact, durable equipment. It consists basically of a paraffin storage pot and dispenser, control panel, warming caddy for base molds, working platform with hot and cold spots for orientation, chiller plate, cool storage drawer and a waste drawer for collecting excess paraffin from the working platform. Electrical outlets on the rear of the unit can be used for related or accessory equipment.